Optical arbitrary waveform measurement (OAWM) using silicon photonic slicing filters (bibtex)
by Fang, Dengyang, Zazzi, Andrea, Müller, Juliana, Drayss, Daniel, Füllner, Christoph, Marin-Palomo, Pablo, Tabatabaei Mashayekh, Alireza, Dipta Das, Arka, Weizel, Maxim, Gudyriev, Sergiy, Freude, Wolfgang, Randel, Sebastian, Scheytt, J. Christoph, Witzens, Jeremy and Koos, Christian
Reference:
Optical arbitrary waveform measurement (OAWM) using silicon photonic slicing filters (Fang, Dengyang, Zazzi, Andrea, Müller, Juliana, Drayss, Daniel, Füllner, Christoph, Marin-Palomo, Pablo, Tabatabaei Mashayekh, Alireza, Dipta Das, Arka, Weizel, Maxim, Gudyriev, Sergiy, Freude, Wolfgang, Randel, Sebastian, Scheytt, J. Christoph, Witzens, Jeremy and Koos, Christian), In J. Light. Technol., volume 40, 2022.
Bibtex Entry:
@article {10.1109/JLT.2021.3130764,
    AUTHOR = {Fang, Dengyang and Zazzi, Andrea and M\"{u}ller, 
              Juliana and Drayss, Daniel and F\"{u}llner, 
              Christoph and Marin-Palomo, Pablo and Tabatabaei 
              Mashayekh, Alireza and Dipta Das, Arka and Weizel, 
              Maxim and Gudyriev, Sergiy and Freude, Wolfgang 
              and Randel, Sebastian and Scheytt, J. Christoph 
              and Witzens, Jeremy and Koos, Christian},
     TITLE = {Optical arbitrary waveform measurement {(OAWM)}
              using silicon photonic slicing filters},
   JOURNAL = {J. Light. Technol.},
  FJOURNAL = {Journal of Lightwave Technology},
    VOLUME = {40},
      YEAR = {2022},
     MONTH = {mar},
    NUMBER = {6},
     PAGES = {1705--1717},
      ISSN = {0733-8724},
       DOI = {10.1109/JLT.2021.3130764},
       URL = {https://doi.org/10.1109/JLT.2021.3130764},
}
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