by Fang, Dengyang, Zazzi, Andrea, Müller, Juliana, Drayss, Daniel, Füllner, Christoph, Marin-Palomo, Pablo, Tabatabaei Mashayekh, Alireza, Dipta Das, Arka, Weizel, Maxim, Gudyriev, Sergiy, Freude, Wolfgang, Randel, Sebastian, Scheytt, J. Christoph, Witzens, Jeremy and Koos, Christian
Reference:
Optical arbitrary waveform measurement (OAWM) using silicon photonic slicing filters (Fang, Dengyang, Zazzi, Andrea, Müller, Juliana, Drayss, Daniel, Füllner, Christoph, Marin-Palomo, Pablo, Tabatabaei Mashayekh, Alireza, Dipta Das, Arka, Weizel, Maxim, Gudyriev, Sergiy, Freude, Wolfgang, Randel, Sebastian, Scheytt, J. Christoph, Witzens, Jeremy and Koos, Christian), In J. Lightwave Technol., volume 40, 2022.
Bibtex Entry:
@article {10.1109/JLT.2021.3130764,
AUTHOR = {Fang, Dengyang and Zazzi, Andrea and M\"{u}ller,
Juliana and Drayss, Daniel and F\"{u}llner,
Christoph and Marin-Palomo, Pablo and Tabatabaei
Mashayekh, Alireza and Dipta Das, Arka and Weizel,
Maxim and Gudyriev, Sergiy and Freude, Wolfgang
and Randel, Sebastian and Scheytt, J. Christoph
and Witzens, Jeremy and Koos, Christian},
TITLE = {Optical arbitrary waveform measurement {(OAWM)}
using silicon photonic slicing filters},
JOURNAL = {J. Lightwave Technol.},
FJOURNAL = {Journal of Lightwave Technology},
VOLUME = {40},
YEAR = {2022},
MONTH = {mar},
NUMBER = {6},
PAGES = {1705--1717},
ISSN = {0733-8724},
DOI = {10.1109/JLT.2021.3130764},
URL = {https://doi.org/10.1109/JLT.2021.3130764},
}